Book Search

1. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

   Edited by Sandeep K. Goel, Krishnendu Chakrabarty

   Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues...

   To Be Published December 14th 2012 by CRC Press